Double Beam UV-Vis Spectrophotometer LT-DUV304

Double Beam UV-Vis Spectrophotometer LT-DUV304

Double Beam UV-Vis Spectrophotometer LT-DUV304 with 0.1 to 5 nm adjustable bandwidth supports detailed optical measurement workflows. Operators prepare samples, configure analysis settings through software, and perform calibration before testing. Sample readings are collected and reviewed throughout the run for accurate evaluation. Measurement data can be examined, compared, and saved for reporting, maintaining an organized process from sample loading through final data assessment.

Catalog

Qty:

$ 3,520.00

Specifications

Light Source Deuterium & Tungsten Lamps
Optical System Double Beam Design
Wavelength Range 190–1100 nm
Spectral Bandwidth 1 nm
Wavelength Accuracy ±0.3 nm
Stray Light ≤0.02%T
Photometric Range −4 to 4 Abs
Photometric Accuracy ±0.2%T
Photometric Repeatability ≤0.15%T
Stability ±0.001A/h
Detector High-Sensitivity Photomultiplier
Display Color Touch Screen
Cell Holder Multi-Cell Holder
PC Interface USB Connectivity
Power Supply AC 220V / 50Hz
Dimensions (L×W×H) 650 × 500 × 280 mm
Net Weight 26 kg
Gross Weight 30 kg

Features

  • High Sensitivity Detection
  • Research-Level Analysis
  • Adjustable Measurement Settings
  • Advanced Optical Performance
  • Software-Controlled Operation
  • Comprehensive Data Evaluation

Application

  • High Sensitivity Analysis: Detect low-level signals. 
  • Spectrum Scanning: Assess spectral characteristics. 
  • Bandwidth Adjustment: Optimize measurements. 
  • Quantitative Analysis: Generate sample data. 
  • Result Verification: Compare sample readings. 
  • Data Processing: Review and store results.

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